EXAFS and surface EXAFS from measurements of X-ray reflectivity
- 20 April 1980
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 13 (11), L249-L253
- https://doi.org/10.1088/0022-3719/13/11/002
Abstract
Calculated X-ray reflectivity spectra near glancing incidence show extended fine structure. The authors show that such spectra are surface sensitive and may be used to determine structural parameters for both substrates and absorbed overlayers.Keywords
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