Experimental determination of the inelastic mean free path (IMFP) of electrons in Cr, Mo, Ge and Si based on the elastic peak intensity ratio with a Ni reference sample
- 1 July 1995
- journal article
- Published by Elsevier in Surface Science
- Vol. 331-333, 1203-1207
- https://doi.org/10.1016/0039-6028(95)00070-4
Abstract
No abstract availableKeywords
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