Electrical resistivity and thermal expansion of La1−xCexSn3 and CeIn3−ySny
- 1 November 1979
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 50 (B11), 7572-7574
- https://doi.org/10.1063/1.326848
Abstract
We have measured the temperature dependence of the electrical resistivity and thermal expansion of La1−xCexSn3, CeSn2In and LaSn2In from 300K to 1.5K. The CeSn3 system is interesting because a variety of previous measurements seem to suggest that the Ce ions within this system may display intermediate valence behavior. Both the thermal expansion measurements and resistivity data for these systems are presented and compared to both other known mixed valence systems and predictions for concentrated Kondo systems.Keywords
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