Force Titration of a Carboxylic Acid Terminated Self-Assembled Monolayer Using Chemical Force Microscopy
- 1 March 1997
- journal article
- novel characterization-techniques-and-spm
- Published by Taylor & Francis in Molecular Crystals and Liquid Crystals
- Vol. 294 (1), 99-102
- https://doi.org/10.1080/10587259708032258
Abstract
Ω-Mercaptoundecanoic acid self-assembled monolayer (SAM) on gold was titrated with buffered water and chemical force microscopy (CFM) was used to follow the titration process by measuring the adhesion force between the SAM-modified substrate and probe tip The adhesion force vs pH curve thus obtained, which can be named as force titration curve, was found to show a big hump around pH 5. Taking the contact-angle titration result together, an interpretation on this unique force titration behavior is made in terms of the rearrangement of the surface carboxylic acid groups when the probe tip and the substrate come into contact.Keywords
This publication has 9 references indexed in Scilit:
- Chemical Force Microscopy: Exploiting Chemically-Modified Tips To Quantify Adhesion, Friction, and Functional Group Distributions in Molecular AssembliesJournal of the American Chemical Society, 1995
- Contact-Angle Titrations of Mixed .omega.-Mercaptoalkanoic Acid/Alkanethiol Monolayers on Gold. Reactive vs Nonreactive Spreading, and Chain Length Effects on Surface pKa ValuesLangmuir, 1994
- Functional Group Imaging by Chemical Force MicroscopyScience, 1994
- The Wetting of Monolayer Films Exposing Ionizable Acids and BasesLangmuir, 1994
- Molecular mechanisms associated with adhesion and contact angle hysteresis of monolayer surfacesThe Journal of Physical Chemistry, 1991
- High resolution atomic force microscopy potentiometryJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Force microscopy with a bidirectional capacitance sensorReview of Scientific Instruments, 1990
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986