Absolute emission cross section for electron-impact excitation ofto the () level
- 1 October 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 18 (4), 1353-1362
- https://doi.org/10.1103/physreva.18.1353
Abstract
Crossed beams of electrons and ions have been used to measure the absolute emission cross section for the process, (548.5 nm), from below the threshold at 61.26 to 162 eV. The cross section exhibits the sharp onset at threshold characteristic of positive-ion excitation. The cross section at threshold is deduced to be 2.0 × , decreasing to 0.2 × at 162 eV. Total uncertainties at a 68% confidence level are typically about ±15%. Pronounced structure is observed in the near-threshold region. From about 1.5 times the threshold energy to the highest energies measured, the cross section follows the generally predicted behavior for to transitions. Theoretical predictions of the cross sections differ from one another by up to a factor of 2, and none appears to fit the data really well.
Keywords
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