Photoelectron Spectrometry: A New Approach to X-Ray Analysis

Abstract

Photoelectron spectrometry is shown to be an excellent technique for the analysis of x rays in the ultrasoft and soft x-ray regions. X rays are converted into photoelectrons which are ejected from a suitable atomic level, and the photoelectrons are analyzed with an electron spectrometer. The method is energy dispersive, provides a resolution ranging from 0.1 eV at 20 eV to 1.1 eV at 3 keV, and gives well-defined intensity characteristics throughout the range. The energy range can be extended into the 10 keV decade. Properties of the new technique are discussed, compared with conventional techniques, and exemplified by a series of measurements which include determination of the emission spectra of M x rays of yttrium to rhodium, L x rays of zirconium, and the band structures of molybdenum and holmium.