Influence of Contacts on the Measurement of the Permittivity of Silicon Single Crystals
- 1 May 1970
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (6), 2732-2733
- https://doi.org/10.1063/1.1659291
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Dielectric Anomalies in Silicon Single CrystalsJournal of Applied Physics, 1966