X-Ray Evanescent-Wave Absorption and Emission
- 17 January 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 50 (3), 153-156
- https://doi.org/10.1103/physrevlett.50.153
Abstract
The presence and properties of x-ray evanescent waves are demonstrated detecting their absorption and their excitation in the vicinity of a target surface. The role of microscopic reversibility in relating the two cases is discussed and practical applications of the phenomena to probe interfaces are suggested.Keywords
This publication has 3 references indexed in Scilit:
- Grazing-incidence diffraction and the distorted-wave approximation for the study of surfacesPhysical Review B, 1982
- X-Ray Diffraction Study of the Ge(001) Reconstructed SurfacePhysical Review Letters, 1981
- X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interfaceJournal of Applied Physics, 1979