Yield estimation for efficient design centring assuming arbitrary statistical distributions
- 1 July 1978
- journal article
- research article
- Published by Wiley in International Journal of Circuit Theory and Applications
- Vol. 6 (3), 289-303
- https://doi.org/10.1002/cta.4490060306
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Idealized statistical models for low-cost linear circuit yield analysisIEEE Transactions on Circuits and Systems, 1977
- Regionalization: A method for generating joint density estimatesIEEE Transactions on Circuits and Systems, 1976
- Optimization of design tolerances using nonlinear programmingJournal of Optimization Theory and Applications, 1974
- Automated network design with optimal tolerancesIEEE Transactions on Circuits and Systems, 1974