A colloid-SEM method for the study of fine magnetic domain structures
- 1 April 1977
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 30 (7), 355-356
- https://doi.org/10.1063/1.89398
Abstract
A simple method to obtain fine magnetic domain patterns is described. The method has two processes, the first is to make the usual Bitter patterns and the second to observe dried colloidal particles on domain boundaries by a scanning electron microscope (SEM) in the secondary electron mode. Micrographs of domain patterns of hexagonal cobalt have been shown at magnifications of SEM from 2000 to 5000. Owing to the large focal depth of SEM, it is able to observe domains on both surfaces of a crystal edge at the same time, and examples have been shown.Keywords
This publication has 18 references indexed in Scilit:
- Magnetic domain contrast from ferromagnetic materials in the scanning electron microscopePhysica Status Solidi (a), 1974
- Observation of magnetic domains in nickel using the scanning electron microscopeApplied Physics Letters, 1974
- Contrastes de domaines magnétiques dans le fer-silicium observés en microscopie à balayageRevue de Physique Appliquée, 1974
- Comments on a new technique for the study of ferromagnetic domain boundariesJournal of Scientific Instruments, 1966
- A new technique for the study of ferromagnetic domain boundariesJournal of Scientific Instruments, 1965
- Thickness Dependence of Domain Structure in CobaltPhysica Status Solidi (b), 1963
- Methods of Improving the Sensitivity of the Bitter TechniqueProceedings of the Physical Society, 1962
- New techniques for the study of Bitter figuresBritish Journal of Applied Physics, 1958
- Elektronenmikroskopische Untersuchung magnetischer PulvermusterAnnalen der Physik, 1957
- A Study of Bitter Figures using the Electron MicroscopeProceedings of the Physical Society. Section B, 1956