Observation of Compositional Separation in CoCrTa Thin Film Using Transmission Electron Microscope with Imaging Filter

Abstract
The elemental mapping of a CoCrTa thin film deposited at 270° C has been performed using a transmission electron microscope equipped with an imaging filter. A compositional separation, which consists of Co-enriched areas and a Cr-enriched phase around them, is quantitatively observed. The Co-enriched areas are about 20 nm in diameter and the Cr-enriched phase extends with a two-dimensional network, which corresponds to grain boundaries. Intragrain Cr-enriched areas, which are less enriched than at the grain boundaries, are also observed.