Electromigration of the conducting polymer in organic semiconductor devices and its stabilization by cross-linking
- 2 July 2007
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 91 (1), 013511
- https://doi.org/10.1063/1.2749178
Abstract
X-ray photoelectron spectroscopy(XPS) measurement of the ratio of poly(3,4-ethylenedioxythiophene) (PEDT) to polystyrenesulfonate (PSS) reveals accumulation of PEDT + at the interface between the PEDT:PSSH hole-injection layer and the organic semiconductor during diode operation. This ionic drift of PEDT + occurs even at low fields of 1 V cm − 1 , which will have an impact on the operational stability of the characteristics of organic light-emitting diodes.XPS and Raman spectroscopy indicate that dedoping of PEDT + does not occur significantly in hole-only devices. Cross-linking at the 1 mol % level can stabilize the conducting polymer sufficiently against electromigration.Keywords
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