Rigid-Tail Helium Cryostat for X Ray Diffraction Studies of Crystallized Gases
- 1 September 1965
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 36 (9), 1316-1318
- https://doi.org/10.1063/1.1719885
Abstract
A rigid‐tail cryostat suitable for x ray back‐reflection diffraction studies requiring temperature control within a few hundredths of a degree for extended time intervals in the range above 2.3°K is described. The specimen chamber permits the growth, visual study, thermal etching, and annealing of crystallized gases. It may also be pressurized to 20 atm for x ray studies of compressibility.Keywords
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