Thin film x-ray spectrometry
- 31 December 1978
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 3, 397-400
- https://doi.org/10.1016/s0304-3991(78)80061-8
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Quantitative X-ray energy dispersive analysis with the transmission electron microscopeX-Ray Spectrometry, 1975
- Quantitative Electron Microprobe Analysis of Thin Films on SubstratesIBM Journal of Research and Development, 1974