Electron escape depth in silicon
- 1 January 1974
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 3 (6), 427-434
- https://doi.org/10.1016/0368-2048(74)80029-0
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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