Dark-line observations in failed quantum well lasers
- 18 April 1988
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 52 (16), 1347-1348
- https://doi.org/10.1063/1.99640
Abstract
The electron-beam-induced current technique has been used to disclose dark-line patterns in degraded AlxGa1−xAs quantum well lasers. At least four distinct types of pattern exist, each being characteristic of a particular device structure.Keywords
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