Exafs measurements on Nb3Ge thin films
- 5 September 1977
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 23 (12), 875-878
- https://doi.org/10.1016/0038-1098(77)90704-9
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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