Measurements of low-frequency noise in thick film resistors
- 1 September 1971
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 8 (3), 193-197
- https://doi.org/10.1016/0040-6090(71)90107-6
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Digital analysis of current noise at very low frequenciesRadio and Electronic Engineer, 1968
- Excess Noise in-Type GermaniumPhysical Review B, 1957
- Hall Effect NoisePhysical Review B, 1955