Trace Element Measurements with Synchrotron Radiation
- 1 January 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 30 (2), 1339-1342
- https://doi.org/10.1109/tns.1983.4332526
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- X-Ray Fluorescence Microprobe for Chemical AnalysisPublished by Springer Nature ,1980
- Limits for qualitative detection and quantitative determination. Application to radiochemistryAnalytical Chemistry, 1968
- Effects of field imperfections on radial stability in a three-sector cyclotronNuclear Instruments and Methods, 1962