Atomic-Scale Imaging of Wall-by-Wall Breakdown and Concurrent Transport Measurements in Multiwall Carbon Nanotubes
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- 14 June 2005
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 94 (23), 236802
- https://doi.org/10.1103/physrevlett.94.236802
Abstract
We report the atomic-scale imaging with concurrent transport measurements of the breakdown of individual multiwall carbon nanotubes inside a transmission electron microscope equipped with a piezomanipulator. We found unexpectedly three distinct breakdown sequences: namely, from the outermost wall inward, from the innermost wall outward, and alternatively between the innermost and the outmost walls. Remarkably, a significant amount of current drop was observed when an innermost wall is broken, proving unambiguously that every wall is conducting. Moreover, the breakdown of each wall in any sequence initiates in the middle of the nanotube, not at the contact, proving that the transport is not ballistic.Keywords
This publication has 20 references indexed in Scilit:
- Geometrical Dependence of High-Bias Current in Multiwalled Carbon NanotubesPhysical Review Letters, 2004
- Ballistic carbon nanotube field-effect transistorsNature, 2003
- First-Principles Phase-Coherent Transport in Metallic Nanotubes with Realistic ContactsPhysical Review Letters, 2003
- Logic Circuits with Carbon Nanotube TransistorsScience, 2001
- Carbon nanotube field-effect invertersApplied Physics Letters, 2001
- Carbon Nanotube Inter- and Intramolecular Logic GatesNano Letters, 2001
- Engineering Carbon Nanotubes and Nanotube Circuits Using Electrical BreakdownScience, 2001
- Crossed Nanotube JunctionsScience, 2000
- Carbon Nanotube Quantum ResistorsScience, 1998
- Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon NanotubesScience, 1996