Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method
- 1 March 1986
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 25 (5), 769-774
- https://doi.org/10.1364/ao.25.000769
Abstract
Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren object we have calculated 2-D beam deviation profiles. It is shown that experimental schlieren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density, and electron density gradients.This publication has 9 references indexed in Scilit:
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