Proper choice of the measuring frequency for determining fT of bipolar transistors
- 31 January 1983
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 26 (1), 75-82
- https://doi.org/10.1016/0038-1101(83)90164-8
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- An experimental determination of the forward-biased emitter-base capacitanceSolid-State Electronics, 1978