Measurement of Gas Temperature Profile in Discharge Region of Excimer Laser with Laser Schlieren Method
- 1 November 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (11R)
- https://doi.org/10.1143/jjap.32.4980
Abstract
Shock waves are generated by pulse discharges in the cavity of excimer lasers. The shock waves cause arcing, nonhomogeneous excitation of laser gas and limitation of repetition rate of a high-repetition-rate excimer laser. Distribution of temperature rise by pulse discharge is an essential factor for generation and propagation of shock waves. Gas temperature profiles in the discharge region of the excimer laser cavity are measured by a laser schlieren method for single-pulse operations. The results show that the temperature distribution depends on the xenon concentration. In the cases of pure helium and higher xenon concentration, the temperature distributions are steeper than those in the cases of lower xenon concentration.Keywords
This publication has 5 references indexed in Scilit:
- Output characteristics of ultrahigh repetition rate and high-power XeCl excimer laserPublished by SPIE-Intl Soc Optical Eng ,1993
- Effects of xenon gas on generation and propagation of shock waves in the cavity of excimer laserPublished by SPIE-Intl Soc Optical Eng ,1993
- XeCl discharge diagnostic by holographic interferometryApplied Physics B Laser and Optics, 1988
- Determination of electron density in discharge-pumped excimer laser using Stark broadening of Hβ lineJournal of Applied Physics, 1986
- Improved Uniform-Field Electrode Profiles for TEA Laser and High-Voltage ApplicationsReview of Scientific Instruments, 1973