Low-temperature, small-sample reflectivity measurements in a commercial rapid-scan Michelson interferometer
- 31 January 1989
- journal article
- Published by Elsevier in Infrared Physics
- Vol. 29 (1), 143-148
- https://doi.org/10.1016/0020-0891(89)90016-x
Abstract
No abstract availableKeywords
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