Direct electro-optic sampling of transmission-line signals propagating on a GaAs substrate

1 January 1984

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 20 (20), 818-819
https://doi.org/10.1049/el:19840556

Abstract

We report a new picosecond electro-optic sampling probe suitable for noncontact electronic characterisation of high-speed monolithic GaAs integrated circuits.

Keywords

TRANSMISSION-LINE SIGNALS
MONOLITHIC GAAS INTEGRATED CIRCUITS
GAAS SUBSTRATE
PICOSECOND ELECTROOPTIC SAMPLING PROBE
NONCONTACT ELECTRONIC CHARACTERISATION
MICROSTRIP TRANSMISSION LINE

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