Electron Microscopy of Prismatic Dislocations in Silicon
- 1 February 1962
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 33 (2), 568-569
- https://doi.org/10.1063/1.1702467
Abstract
Transmission electron micrographs of (111) prismatic loops in gold‐diffused silicon have been obtained. The loops were about 2 μ in diameter. From the contrast effects seen and for a number of other reasons it is concluded that the loops surround a stacking fault rather than coherent platelets of gold.Keywords
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