Computer Program Available for Thin Film Studies Using Elliptically Polarized Light*
- 1 December 1963
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 53 (12), 1451-1452
- https://doi.org/10.1364/josa.53.001451
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962