Characterization of silicon compounds using the Auger parameter in X-ray Photoelectron Spectroscopy (XPS)
- 1 April 1987
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 28 (2), 103-110
- https://doi.org/10.1016/0169-4332(87)90057-2
Abstract
No abstract availableKeywords
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