The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysis
- 1 February 1986
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 19 (1), 10-18
- https://doi.org/10.1107/s0021889886090076