Crystalline structure of germanium films on silicon substrates
- 1 February 1971
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 7 (2), 117-125
- https://doi.org/10.1016/0040-6090(71)90030-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The Effect of Dislocations on the Intensity Jumps at the Interferential Transmission of X-Rays near the K-Edge of Absorption in GePhysica Status Solidi (b), 1968
- Integral Characteristics of Anomalous Transmission of X‐RaysPhysica Status Solidi (b), 1966
- Effect of Crystal Perfection and Polarity on Absorption Edges Seen in Bragg DiffractionJournal of Applied Physics, 1962