High resolution imaging of defects in sigma phase in a stainless steel
- 1 May 1980
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 119 (1), 169-175
- https://doi.org/10.1111/j.1365-2818.1980.tb04087.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The Measurement Of Excess Volume At Grain Boundaries Using Transmission Electron MicroscopyJournal of Microscopy, 1979
- The lattice-imaging technique for a duplex stainless steelScripta Metallurgica, 1979
- The Sigma PhaseInternational Materials Reviews, 1966
- A study of defect sub-structures in the Fe–Cr sigma phase by means of transmission electron microscopyPhilosophical Magazine, 1962
- The determination of the crystal structure of the σ phase in the iron–chromium and iron–molybdenum systemsActa Crystallographica, 1954