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Cryogenic behavior of scaled CMOS devices
Home
Publications
Cryogenic behavior of scaled CMOS devices
Cryogenic behavior of scaled CMOS devices
JS
J.W. Schrankler
J.W. Schrankler
JH
J.S.T. Huang
J.S.T. Huang
RL
R.S.L. Lutze
R.S.L. Lutze
HV
H.P. Vyas
H.P. Vyas
GK
G.D. Kirchner
G.D. Kirchner
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1 January 1984
proceedings article
Published by
Institute of Electrical and Electronics Engineers (IEEE)
https://doi.org/10.1109/iedm.1984.190792
Abstract
No abstract available
Keywords
SCALED CMOS DEVICES
CRYOGENIC BEHAVIOR
BEHAVIOR OF SCALED
Cited by 20 articles