Comparison of Atomic Force Microscopy and Nanoscale Optical Microscopy for Measuring Step Heights

Abstract
Comparison of measured step heights was carried out by means of nanoscale optical microscopes and an atomic force microscope (AFM) using a Frank spiral as a standard reference. It was found that the individual step height of the spiral was about 16.5 nm as obtained using two-beam interferometry, but AFM showed the height as 23.45-18.98 nm. This discrepancy was discussed briefly.