Electro-migration as a probe to study localization
- 31 December 1981
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 40 (11), 987-989
- https://doi.org/10.1016/0038-1098(81)90050-8
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Scaling studies of localizationJournal of Non-Crystalline Solids, 1980
- Scaling Theory of Localization: Absence of Quantum Diffusion in Two DimensionsPhysical Review Letters, 1979
- Maximum Metallic Resistance in Thin WiresPhysical Review Letters, 1977
- Electro-migration in a two-band metal and in Hall field; Application to an electron-hole dropSolid State Communications, 1976
- Electrotransport of Interstitial H and D in V, Nb, and Ta as Experimental Evidence for the Direct Field ForcePhysical Review Letters, 1976
- Stochastic Problems in Physics and AstronomyReviews of Modern Physics, 1943