Technique for shaping scanning tunneling microscope tips

1 June 1987

journal article
letter
Published by AIP Publishing in Review of Scientific Instruments

Vol. 58 (6), 1115
https://doi.org/10.1063/1.1139618

Abstract

Two innovations have been applied to improve a method developed earlier for the production of field‐ion tips. The new technique produces sharper, smaller tips with low‐aspect ratio shanks to fulfill the specific needs of scanning tunneling microscopy.

Keywords

SCANNING ELECTRON MICROSCOPY
TUNNEL EFFECT
MECHANICAL VIBRATIONS
ELECTRON MICROSCOPES
RESOLUTION
FABRICATION
DESIGN
EQUIPMENT
ELECTRIC CONTACTS
PERFORMANCE TESTING
ELECTRIC PROBES
ELECTRON MICROSCOPY

This publication has 1 reference indexed in Scilit:

FIELD ION MICROSCOPY
Published by Defense Technical Information Center (DTIC) ,1969

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