The Physics of Ferroelectric Memories
- 1 July 1998
- journal article
- Published by AIP Publishing in Physics Today
- Vol. 51 (7), 22-27
- https://doi.org/10.1063/1.882324
Abstract
Imagine you are in the last stages of typing your thesis, the year is 1980, and it's a hot, hazy summer afternoon, a thunderstorm brews on the horizon. Tense and tired, you have forgotten to save the document on your hard disk. Suddenly, lightning strikes! Your computer shuts down. Your final chapter is lost. The ability of ferroelectric materials to switch robustly from one polarization state to another forms the basis of a new thin film technology for storing data.Keywords
This publication has 12 references indexed in Scilit:
- NANO-phase SBT-family ferroelectric memoriesIntegrated Ferroelectrics, 1998
- Nanoscale imaging of domain dynamics and retention in ferroelectric thin filmsApplied Physics Letters, 1997
- Calculated size dependence of ferroelectric properties in PbZrO3-PbTiO3 systemIntegrated Ferroelectrics, 1996
- Photoinduced changes in the fatigue behavior of SrBi2Ta2O9 and Pb(Zr,Ti)O3 thin filmsJournal of Applied Physics, 1996
- High-Permittivity Perovskite Thin Films for Dynamic Random-Access MemoriesMRS Bulletin, 1996
- Structure and Device Characteristics of SrBi2Ta2O9-Based Nonvolatile Random-Access MemoriesMRS Bulletin, 1996
- A theory of D-E hysteresis loopIntegrated Ferroelectrics, 1995
- Nanosecond switching of thin ferroelectric filmsApplied Physics Letters, 1991
- Fatigue and switching in ferroelectric memories: Theory and experimentJournal of Applied Physics, 1990
- Thermodynamic stability of thin ferroelectric filmsSolid State Communications, 1972