Solid-state amorphization in Al-Pt multilayers by low-temperature annealing
- 15 June 1989
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 39 (18), 13067-13071
- https://doi.org/10.1103/physrevb.39.13067
Abstract
We report the solid-state amorphization reaction between crystalline Al and Pt layers. Multilayer samples were made by sequential evaporation of layers of Al and Pt. In the as-deposited state the sample contains an amorphous phase at the Al-Pt interfaces. This amorphous phase grows during vacuum annealing at temperatures between 150 and 220 °C. A first estimation of the composition range of the amorphous phase is given, and the thermodynamic, kinetic, and structural-stability criteria proposed for solid-state amorphization are discussed in relation to the Al-Pt system.Keywords
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