Technique for XPS measurements of volatile adsorbed layers: Application to studies of sulphide flotation
- 1 December 1992
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (12), 807-810
- https://doi.org/10.1002/sia.740181205
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- An X-ray photoelectron spectroscopic investigation of chalcopyrite and pyrite surfaces after conditioning in sodium sulfide solutionsInternational Journal of Mineral Processing, 1990
- In-situ FTIR study of ethyl xanthate adsorption on sulfide minerals under conditions of controlled potentialInternational Journal of Mineral Processing, 1989
- An X-ray photoelectron spectroscopic study of the oxidation of chalcopyriteAustralian Journal of Chemistry, 1984