Effect of Stress on the Low-Temperature Phase Transformation in V3Si
- 1 August 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (9), 3447-3449
- https://doi.org/10.1063/1.1708879
Abstract
The influence of stress on the low‐temperature structural transformation in V3Si was investigated. A large stress can completely suppress the transformation as observed by x‐ray Berg‐Barrett and lattice parameter measurements. A lower stress can affect the morphology and extent of the transformation but leaves the transformation temperature Tm unchanged.Keywords
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