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Enhanced hydrogenation in polycrystalline silicon thin films using low-temperature ultrasound treatment
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Publications
Enhanced hydrogenation in polycrystalline silicon thin films using low-temperature ultrasound treatment
Enhanced hydrogenation in polycrystalline silicon thin films using low-temperature ultrasound treatment
SO
S. Ostapenko
S. Ostapenko
LJ
L. Jastrzebski
L. Jastrzebski
JL
J. Lagowski
J. Lagowski
RS
R. K. Smeltzer
R. K. Smeltzer
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13 May 1996
journal article
Published by
AIP Publishing
in
Applied Physics Letters
Vol. 68
(20)
,
2873-2875
https://doi.org/10.1063/1.116353
Abstract
No abstract available
Keywords
GRAIN BOUNDARY
THIN FILM
POTENTIAL DIFFERENCE
ATOMIC FORCE MICROSCOPE
ULTRASOUND
ELECTRIC CONDUCTIVITY
Cited by 15 articles