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Abstract: AES characterization of oxidized films of Mg, Al, and Si
Home
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Abstract: AES characterization of oxidized films of Mg, Al, and Si
Abstract: AES characterization of oxidized films of Mg, Al, and Si
YS
Y. E. Strausser
Y. E. Strausser
JJ
J. S. Johannessen
J. S. Johannessen
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1 January 1976
journal article
Published by
American Vacuum Society
in
Journal of Vacuum Science and Technology
Vol. 13
(1)
,
48-49
https://doi.org/10.1116/1.568905
Abstract
No abstract available
Keywords
AES CHARACTERIZATION
OXIDIZED FILMS
CHARACTERIZATION OF OXIDIZED
FILMS OF MG
Cited by 6 articles