Accurate modeling for submicrometer-gate Si and GaAs MESFET's using two-dimensional particle simulation
- 1 October 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 30 (10), 1376-1380
- https://doi.org/10.1109/T-ED.1983.21302