X-ray diffraction evidence for the existence of epitaxial microcrystallites in thermally oxidized SiO2 thin films on Si(111) surfaces
- 22 September 1996
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 166 (1-4), 786-791
- https://doi.org/10.1016/0022-0248(95)00496-3
Abstract
No abstract availableKeywords
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