Plasma‐polymerized films of trimethylsilane deposited on cold‐rolled steel substrates. Part 1. Characterization by XPS, AES and TOF‐SIMS
- 1 September 1993
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 20 (10), 845-859
- https://doi.org/10.1002/sia.740201008
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Characterization of polymer surfaces and polymer–metal interfaces by static secondary ion mass spectrometrySurface and Interface Analysis, 1992
- Comparative and complementary plasma desorption mass spectrometry/secondary ion mass spectrometry investigations of polymer materialsAnalytical Chemistry, 1991
- Plasma polymerized organosilanes as interfacial modifiers in polymer-metal systemsJournal of Adhesion Science and Technology, 1991
- Kinetic and Mechanistic Aspects of Plasma PolymerizationPublished by Elsevier ,1985