Finite Element Method Simulation of the Field Distribution for AFM Tip-Enhanced Surface-Enhanced Raman Scanning Microscopy
- 29 January 2003
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 107 (7), 1574-1584
- https://doi.org/10.1021/jp022060s
Abstract
No abstract availableKeywords
This publication has 39 references indexed in Scilit:
- Near-Field Scanning Optical MicroscopyChemical Reviews, 1999
- Fractals in Microcavities: Giant Coupled, Multiplicative Enhancement of Optical ResponsesPhysical Review Letters, 1999
- Near-field optical spectroscopy of individual surface-plasmon modes in colloid clustersPhysical Review B, 1999
- Peer Reviewed: Near-Field Scanning Optical Microscopy.Analytical Chemistry, 1999
- Surface-enhanced Raman scatteringChemical Society Reviews, 1998
- Probing Single Molecules and Single Nanoparticles by Surface-Enhanced Raman ScatteringScience, 1997
- Population Pumping of Excited Vibrational States by Spontaneous Surface-Enhanced Raman ScatteringPhysical Review Letters, 1996
- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface-enhanced spectroscopyReviews of Modern Physics, 1985
- Theoretical studies of surface enhanced Raman scatteringAccounts of Chemical Research, 1984