Three-dimensional simulation of helix traveling-wave tube cold-test characteristics using MAFIA
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 43 (8), 1317-1319
- https://doi.org/10.1109/16.506790
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Novel high-gain, improved-bandwidth, finned-ladder V-band traveling-wave tube slow-wave circuit designIEEE Transactions on Electron Devices, 1995
- Theoretical and experimental TWT helix loss determinationIEEE Transactions on Electron Devices, 1979