Electrolytic-Tank Measurements for Microwave Metallic Delay-Lens Media

Abstract

In this paper it is shown how the low frequency index of refraction of a metallic delay-lens medium may be calculated from electrolytic-tank measurements on individual metallic elements of the medium. The proximity between adjacent elements is taken exactly into account for low frequencies. The test apparatus is described, and measured results are presented for three kinds of delay-lens structures.