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Grain Boundary Analysis in Superplastic SiO2 - Doped TZP
Home
Publications
Grain Boundary Analysis in Superplastic SiO2 - Doped TZP
Grain Boundary Analysis in Superplastic SiO2 - Doped TZP
PT
Parjaree Thavorniti
Parjaree Thavorniti
YI
Yuichi Ikuhara
Yuichi Ikuhara
TS
Taketo Sakuma
Taketo Sakuma
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1 October 1996
journal article
Published by
Trans Tech Publications, Ltd.
in
Materials Science Forum
Vol. 233-234
,
367-374
https://doi.org/10.4028/www.scientific.net/msf.233-234.367
Abstract
No abstract available
Keywords
ELECTRON MICROSCOPY
FIELD EMISSION TEM
GLASS PHASE
GRAIN BOUNDARY
HIGH-RESOLUTION
SEGREGATION
SUPERPLASTICITY
TZP
Cited by 3 articles