Detection of trace elements in ash samples performed by combining RBS and PIXE
- 31 December 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 191 (1-3), 414-418
- https://doi.org/10.1016/0029-554x(81)91038-7
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Effects of surface roughness on backscattering spectraNuclear Instruments and Methods, 1980
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Study of aluminum oxide films by ion-induced x rays and Rutherford backscatteringJournal of Applied Physics, 1973