High-resolution studies in the decay of 133Ba with semiconductor counters
- 1 January 1968
- journal article
- Published by Elsevier in Nuclear Physics A
- Vol. 108 (1), 209-220
- https://doi.org/10.1016/0375-9474(68)90154-1
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Internal-Conversion-Electron Study of the Decay ofBa133toCs133Physical Review B, 1967
- Electron-gamma and electron-electron coincidence spectrometers with semiconductor countersNuclear Instruments and Methods, 1967
- Levels and transitions in 133CsNuclear Physics, 1966
- Internal conversion coefficient of the 81 keV transition in 133CsNuclear Physics, 1966
- The impact of semiconductor detectors on gamma-ray and electron spectroscopyNuclear Instruments and Methods, 1966
- An internal conversion coefficient spectrometer utilizing semi-conductor detectorsNuclear Instruments and Methods, 1965
- Nuclear Transitions inCs133Physical Review B, 1964
- THE DECAY OF Ba133Canadian Journal of Physics, 1963
- THE CONVERSION ELECTRON SPECTRUM FROM A MASS-SEPARATED SOURCE OF Xe133Canadian Journal of Physics, 1961
- Two-Step Isomeric Transition in(39 hr)Physical Review B, 1951